Bruker AXS D8 Discover X-Ray Diffractometer System
|Laboratory:||X-ray Diffraction Facility|
|Contact Person:||S. Yarmolenko, (336) 285-3225|
X-ray diffraction (XRD) is important non-destructive tool for materials characterization. The D8 DISCOVER for Thin Films combines reflectometry and high resolution X-ray diffraction on a vertical diffractometer. Using the new motorized reflectometry stage and the V- shaped monochromator you will benefit of the advantages of Theta/Theta diffraction setup.